B.Salski, M.Celuch, W.K.Gwarek, "Evaluation of FDTD regimes for scattering from periodic structures", 23rd Annual Review of Progress in Applied Computational Electromagnetics, Verona, March 2007, pp.1815-1822.
B?Salski, W?K?Gwarek, M?Celuch, "Comparison of FDTD excitation models for scatterometry of periodic reticles", 2007 IEEE AP-S Intl?Symp?, Honolulu, June 2007, pp? 1673-1676?
B.Salski, M.Celuch, W.Gwarek, "Enhancements to FDTD modeling for optical metrology applications", SPIE Optical metrology - 18th Intl. Congress on Photonics in Europe, Munich, June 2007.
B.Salski, M.Celuch, W.K. Gwarek, "Review of Complex Looped FDTD and its new applications", 24th Annual Review of Progress in Applied Computational Electromagnetics, Niagara Falls, March - April 2008.
P. Leray, S. Cheng, D. Kandel, M. Adel, A. Marchelli, I. Vakshtein, M. Vasconi, B. Salski, "Diffraction based overlay metrology: accuracy and performance on front end stack", Proc.SPIE, Vol.6922, 22 March 2008.
B. Salski, M. Celuch, W. Gwarek, "FDTD modeling of finite spot scatterometry", 17th International Conference on Microwaves, Radar and Wireless Communications MIKON, Wroclaw, May 2008, pp.706-709.
B. Salski, W. Gwarek, "Hybrid FDTD-Fresnel modeling of microscope imaging", Intl. Conf. on Recent Advances in Microwave Theory and Applications Microwave-2008, Jaipur, India, Nov. 2008, pp. 398-399.
P?Leray, S?Cheng, D?Laidler, D?Kandel, M?Adel, B?Dinu, M?Polli, M?Vasconi, B?Salski, "Overlay metrology for double patterning processes", SPIE Conf? Metrology, Inspection, and Process Control for Microlithography XXIII, March 2009, vol? 7272-15?
B?Salski, W?Gwarek, M?Celuch, "Electromagnetic FDTD modeling of optical problems", Elektronika, nr 4/2009, s?53-55?
B.Salski, W.Gwarek, "Hybrid FDTD-Fresnel modeling of microscopy imaging", Applied Optics, vol.48, No.13, May 2009, pp. 2133-2138.
B. Salski, M.Celuch, W.Gwarek, "Electromagnetic simulations of periodic structures with FDTD tools", Progress in Electromagnetic Research Symp., Aug. 2009, p.627.77